Search results for " elastic Young’s modulus"

Local mechanical properties by Atomic Force Microscopy nanoindentations

2008

The analysis of mechanical properties on a nanometer scale is a useful tool for combining information concerning texture organization obtained by microscopy with the properties of individual components- Moreover, this technique promotes the understanding of the hierarchical arrangement in complex natural materials as well in the case of simpler morphologies arising from industrial processes. Atomic Force Microscopy, AFM, can bridge morphological information, obtained with outstanding resolution, to local mechanical properties. When performing an AFM nanoindentation, the rough force curve, i.e., the plot of the voltage output from the photodiode vs. the voltage applied to the piezo-scanner, …